Key Specs

SpecValueConditionSource
Current Continuous Drain ID 25 C100A (Tc)Digi-Key
Drain-source Voltage (Max)1200 VDigi-Key
Drive Voltage Max RDS On Min RDS On15VDigi-Key
FET Feature-Digi-Key
FET TypeN-ChannelDigi-Key
Gate Charge Qg Max VGS162 nC @ 15 VDigi-Key
Gate-source Voltage (Max)+15V, -4VDigi-Key
Grade-Digi-Key
Input Capacitance Ciss Max VDS4818 pF @ 1000 VDigi-Key
Mounting TypeThrough HoleDigi-Key
Operating Temperature Range-40°C ~ 175°C (TJ)Digi-Key
Package CaseTO-247-4Digi-Key
Power Dissipation (Max)469W (Tc)Digi-Key
Qualification-Digi-Key
RDS On Max ID VGS28.8mOhm @ 50A, 15VDigi-Key
Supplier Device PackageTO-247-4LDigi-Key
TechnologySiCFET (Silicon Carbide)Digi-Key
VGS Th Max ID3.6V @ 17.7mADigi-Key

When To Use

  1. 1200 V industrial inverter → 100 A peak motor drive: The 1200 V maximum drain-source voltage and 100 A continuous current at 25°C make this device suitable for high-voltage, high-current SiC inverter legs. Using a MOSFET with lower voltage rating would risk avalanche breakdown during switching transients, causing device failure.

  2. High-frequency DC-DC conversion → 48 V to 12 V @ 50 A: The low R_DS(on) of 28.8 mΩ at 50 A with a 15 V gate drive reduces conduction losses significantly at high currents, preventing thermal runaway in demanding buck converter stages. A slower MOSFET or one with higher gate charge would increase switching losses and heat dissipation, risking thermal shutdown.

  3. Through-hole power stage upgrade → replacing legacy IGBTs: The SiC MOSFET’s TO-247-4 package with a 469 W maximum power dissipation at case temperature allows direct drop-in replacement to improve efficiency and switching speed in through-hole designs. Using a standard silicon MOSFET with higher gate charge or slower switching can cause excessive switching losses and shoot-through in hard-switched topologies.


When Not To Use

  1. Output current > 100 A continuous at 25°C: The continuous drain current rating of 100 A at 25°C limits this device under heavy loads. Use a multi-phase buck controller with parallel MOSFETs to distribute current and improve thermal management.

  2. Input voltage difference < 1 V for noise-sensitive analog supply: The gate-source voltage max of +15 V/-4 V and lack of low-noise linear regulation disqualify this MOSFET for tight voltage regulation with minimal noise. Use an LDO regulator instead.

  3. Switching frequency above 500 kHz in a compact converter: The gate charge of 162 nC at 15 V limits switching speed and increases driver losses at very high frequencies. Use a high-frequency buck controller designed for ultra-fast gate drive and low gate charge MOSFETs.


Application Notes


Pin numbers are package-specific. Verify against the datasheet pinout diagram before routing.

Gotchas

  1. [Underestimating temperature derating]: The 100 A continuous current rating applies at 25°C case temperature; engineers often assume it holds at higher TJ without checking thermal derating curves, leading to thermal runaway as R_DS(on) increases with temperature. Fix: measure actual case temperature under load and derate current accordingly using provided TJ vs. R_DS(on) graphs.

  2. [Gate driver overshoot causing gate oxide stress]: Because the maximum gate-source voltage is +15 V and -4 V, transient overshoot from fast switching or ringing can exceed these limits unnoticed on a scope with insufficient bandwidth, causing premature gate oxide degradation. Fix: implement RC snubbers or dedicated gate clamps and verify gate voltage with high-bandwidth probes.

  3. [Incorrect SW node layout causing voltage spikes]: A layout with excessive parasitic inductance on the drain or source return path can cause large voltage overshoot and oscillations during switching, triggering false turn-on or device latch-up. Fix: minimize loop area, use Kelvin source connections if possible, and verify switching waveforms on the SW node.

  4. [Startup with no minimum load causing erratic switching]: In hard-switching topologies using this MOSFET, removing the minimum load can cause the converter to enter unstable switching or oscillations due to low conduction current and gate drive thresholds near V_GS(th). Fix: ensure a minimum load or add gate drive bias margin to maintain stable conduction region during startup.