Key Specs

SpecValueConditionSource
Channel TypeSingleDigi-Key
Current Peak Output Source Sink4A, 4ADigi-Key
Digikey Programmable-Digi-Key
Driven ConfigurationHigh-SideDigi-Key
Gate TypeIGBT, SiC MOSFETDigi-Key
Grade-Digi-Key
High Side Voltage Max Bootstrap650 VDigi-Key
Input TypeNon-InvertingDigi-Key
Logic Voltage Vil Vih0.8V, 2.4VDigi-Key
Mounting TypeSurface MountDigi-Key
Number Of Drivers1Digi-Key
Operating Temperature Range-40°C ~ 125°C (TJ)Digi-Key
Package Case8-SOIC (0.154”, 3.90mm Width)Digi-Key
Qualification-Digi-Key
Rise Fall Time (Typ)12ns, 12nsDigi-Key
Supplier Device PackagePG-DSO-8Digi-Key
Voltage Supply10V ~ 22VDigi-Key

When To Use

  1. 650 V high-side gate drive for SiC MOSFET in automotive inverter: The 650 V floating well offset supply voltage and 22 V maximum high-side supply voltage allow direct drive of high-voltage SiC MOSFET gates in automotive traction inverters. Lower-voltage or non-isolated drivers risk shoot-through or latch-up due to insufficient voltage margin or offset handling.

  2. Fast transient switching in industrial motor drives at 4A peak current: The 4 A peak output source and sink current combined with 12 ns typical rise/fall times and 80 ns propagation delays enable tight control of fast-switching IGBTs or MOSFETs, avoiding excessive switching losses and thermal runaway. Using a slower driver or one with lower peak current would cause excessive switching losses and possible device overheating.

  3. High transient immunity applications with up to 50 V/ns offset voltage slew rate: The 50 V/ns maximum allowable offset supply transient protects the driver’s floating well node from destructive voltage spikes in hard-switching environments. Controllers without such transient immunity can suffer latch-up or damage during rapid voltage transitions in hard-switched topologies.


When Not To Use

  1. Output current above 4 A continuous with high efficiency requirement: The 4 A peak driver current limits the maximum continuous current capability. For currents exceeding this, especially where efficiency is critical, use a high-current synchronous buck with external FETs instead.

  2. Battery-powered sensor node with ultra-low quiescent current demand: The typical quiescent current of 350 µA is too high for μA-level sleep-mode operation. Use a low-IQ PFM buck to minimize battery drain during standby.

  3. Switching frequency above 500 kHz for compact magnetics: The propagation delays and switching characteristics are optimized for typical frequencies below 500 kHz. For switching frequencies above 500 kHz, use a high-frequency buck controller designed for faster switching and reduced switching losses.


Application Notes


Gotchas

  1. [Faulty undervoltage recovery sequencing]: Assuming the driver restarts automatically after a VBS or VCC undervoltage event without a new rising edge on HIN leads to a no-output condition. The driver requires a fresh input edge after UVLO clears. Symptom: output gate remains off despite supply recovery. Fix: implement logic to toggle HIN after supply recovers.

  2. [Incorrect CS line pull-up resistor sizing]: Using a too-low value pull-up on the open-drain CS input causes excessive current and distorts the current sense threshold, leading to false overcurrent triggers. Symptom: premature or spurious shutdowns under load. Fix: use recommended pull-up values matching the -50 Ω Rds(on) at 2 mA typical specified and verify CS threshold voltages in-system.

  3. [Noise coupling into FLTC pin]: Routing FLTC without guard traces or near high dV/dt nodes causes false fault latch triggering due to capacitive coupling. Symptom: unexpected fault conditions and shutdowns during normal operation. Fix: route FLTC away from switching nodes and use ground guard traces.

  4. [Thermal dissipation underestimated due to package limits]: Ignoring the 625 mW maximum package power dissipation and 200 °C/W junction-to-ambient thermal resistance causes junction overheating even if current limits are respected. Symptom: device junction temperature rapidly rising, leading to thermal shutdown or reliability degradation. Fix: perform thermal simulation including PCB copper area and heat sinking to keep junction below 150 °C max.