NX3008NBKS,115 vs SIL2324A-TP MOSFET Array Comparison

Quick verdict

For low-voltage, low-current switching tasks, especially in automotive or space-constrained designs, the NX3008NBKS,115 is the better choice due to its logic-level gate drive, AEC-Q101 automotive qualification, and very low gate charge. For applications requiring higher voltage and higher current capability—such as load switching or power management in industrial or consumer electronics—the SIL2324A-TP outperforms with its 100 V rating, 2 A continuous current, and significantly lower on-resistance.

Spec comparison table

SpecNX3008NBKS,115SIL2324A-TPNotes
Configuration2 N-Channel (Dual)2 N-Channel (Dual)Equivalent dual MOSFET arrays
Drain-Source Voltage Max30 V100 VSIL2324A-TP supports over 3x higher voltage, enabling use in higher-voltage systems
Continuous Drain Current @ 25°C350 mA2 ASIL2324A-TP supports nearly 6x higher current, better for higher load applications
Pulsed Drain Current Max1.4 A8 ASIL2324A-TP handles higher transient currents
Drain-Source On-Resistance Typical @ 25°C1.5 Ω280 mΩSIL2324A-TP has significantly lower R_DS(on), reducing conduction losses substantially
Gate Threshold Voltage Typical1.75 V1.5 VNX3008NBKS,115 has slightly higher threshold but both are logic-level compatible
Gate Charge Total Typical @ 4.5 V0.68 nC4.6 nCNX3008NBKS,115 requires ~7x lower gate charge, easing gate driver requirements
Input Capacitance Typical @ 15 V50 pF445 pFNX3008NBKS,115 has much lower input capacitance, enabling faster switching
Output Capacitance Typical6.5 pF23 pFLower output capacitance in NX3008NBKS,115 aids in faster switching
Reverse Transfer Capacitance Typical2.2 pF20 pFNX3008NBKS,115 has lower reverse capacitance, reducing Miller effect
Forward Transconductance Typical310 mS7.1 SSIL2324A-TP has orders of magnitude higher transconductance, indicating stronger drive
Maximum Power Dissipation445 mW1.5 WSIL2324A-TP can dissipate over 3x more power, better suited for higher power applications
Thermal Resistance Junction to Ambient Typical300 K/W (per device)125 °C/W (usually °C/W = K/W)SIL2324A-TP has better thermal resistance, easier thermal management
Junction Temperature Range-55°C to +150°C-55°C to +150°CEquivalent operating temperature range
Package6-TSSOP (SC-88, SOT-363)SOT-23-6LDifferent package types; footprint not compatible
Gate-Source Voltage Max/Min±8 V±20 VSIL2324A-TP tolerates wider gate drive voltage swings
Drain Leakage Current Typical @ 25°C1 µA1 µAComparable leakage at room temperature
ESD Rating2000 VNot specifiedNX3008NBKS,115 specifies 2 kV ESD rating; SIL2324A-TP datasheet does not specify
AEC-Q101 QualificationYesNoNX3008NBKS,115 is automotive qualified; SIL2324A-TP is not
Turn-On Delay Time Typical15–30 ns8.2 nsSIL2324A-TP switches faster, beneficial for high-speed switching
Turn-Off Delay Time Typical69–138 ns14.3 nsSIL2324A-TP has significantly faster turn-off, reducing switching losses
Rise Time Typical11 ns6.3 nsSIL2324A-TP faster switching speeds
Fall Time Typical19 ns4.5 nsSIL2324A-TP faster switching speeds
Gate Leakage Current Typical @ 25°C0.2–1 µANot specifiedNX3008NBKS,115 gate leakage specified, SIL2324A-TP not detailed
Storage Temperature Range-65°C to +150°C-55°C to +150°CNX3008NBKS,115 supports slightly wider low-temp storage range

Design trade-offs

The NX3008NBKS,115 and SIL2324A-TP serve quite different niches despite both being dual N-channel MOSFET arrays. The NX3008NBKS,115 is optimized for low-voltage, low-current applications with very low gate charge and input/output capacitances, which means it can switch faster with less gate drive power and generates less switching loss in low-power circuits. Its logic-level gate drive and AEC-Q101 qualification make it attractive for automotive and industrial environments where reliability and signal-level compatibility matter more than raw power handling.

Conversely, the SIL2324A-TP addresses higher power needs with a 100 V rating and 2 A continuous current capability. Its 280 mΩ R_DS(on) at 2 A significantly reduces conduction losses in higher current paths, while the higher gate charge (4.6 nC typical) and input capacitance (445 pF) require stronger gate drivers and potentially slower switching to avoid excessive switching losses. However, its much faster switching times and lower thermal resistance (125 °C/W vs 300 K/W) simplify thermal management under moderate power dissipation.

From a layout perspective, the NX3008NBKS,115’s smaller input capacitance and gate charge reduce EMI and cross-talk risks, enabling more compact, sensitive designs. The SOT-23-6 package of the SIL2324A-TP is smaller than the 6-TSSOP of the NX3008NBKS,115, which might save PCB area but complicate thermal dissipation due to the smaller thermal pad. The NX3008NBKS’s higher thermal resistance mandates careful thermal design even at its lower power rating.

Cost-wise, the NX3008NBKS,115 will generally be cheaper for low-power applications given its simpler die and lower power rating, but volume pricing depends on supplier and market. The SIL2324A-TP’s higher power capability may justify its higher unit cost in designs where current and voltage margins are critical.

Gate drive considerations are paramount: the NX3008NBKS,115 can be driven directly from low-voltage logic with minimal current, while the SIL2324A-TP demands a gate driver capable of sourcing/sinking several milliamps to charge/discharge its larger gate capacitance quickly, especially if switching at tens or hundreds of kHz.

Use-case fit

Choose NX3008NBKS,115 when…

Choose SIL2324A-TP when…

Drop-in compatibility

These two devices are not pin-compatible or footprint-compatible. The NX3008NBKS,115 comes in a 6-TSSOP (SC-88, SOT-363) package sized approximately 2.2 mm x 1.35 mm, while the SIL2324A-TP is packaged in a smaller SOT-23-6L format. The pin assignments and internal transistor arrangements differ, so substituting one for the other requires PCB redesign and verification of gate drive and thermal management. No direct drop-in substitution is possible without layout and possibly schematic changes.

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