Key Specs

SpecValueConditionSource
Amplifier TypeCurrent SenseDigi-Key
Current Input Bias500 pADigi-Key
Gain Bandwidth Product37 kHzDigi-Key
Mounting TypeSurface MountDigi-Key
Number Of Circuits1Digi-Key
Operating Temperature Range-40°C ~ 125°C (TA)Digi-Key
Output TypeRail-to-RailDigi-Key
Package Case6-TSSOP, SC-88, SOT-363Digi-Key
Quiescent Current (Typ)48µADigi-Key
Slew Rate0.3V/µsDigi-Key
Supplier Device PackageSC-70-6Digi-Key
Voltage Input Offset3 µVDigi-Key
Voltage Supply Span (Max)5.5 VDigi-Key
Voltage Supply Span (Min)1.7 VDigi-Key

When To Use

  1. Battery-powered current sensing in 1.7 V to 5.5 V rails: The low quiescent current of 48µA combined with a wide supply voltage range down to 1.7 V make this part ideal for monitoring current in low-voltage battery-powered systems. Higher bias current amplifiers would drain the battery prematurely, causing early system failure.

  2. Precision current measurement with minimal offset drift: The extremely low input offset voltage of 3 µV and ultra-low input bias current of 500 pA enable accurate sensing of small currents without significant error. Using a general-purpose current sense amplifier with higher offset would result in inaccurate current readings and potential false fault triggers.

  3. Thermally constrained surface-mount applications: The SC-70-6 package with a maximum operating temperature of 125°C supports dense PCB layouts where thermal dissipation is limited. Using a package with higher quiescent current or less favorable thermal characteristics could lead to thermal runaway in tight enclosures.


When Not To Use

  1. High-frequency switching power supplies above 500 kHz: The 37 kHz gain-bandwidth product and 0.3 V/µs slew rate limit the INA190A2IDCKR’s ability to track rapid current changes accurately. Use a high-frequency buck controller instead for switching frequencies exceeding 500 kHz.

  2. Applications requiring galvanic isolation for safety or noise immunity: This device has no isolation barrier and cannot handle common-mode voltages beyond supply range. Use an isolated flyback solution where galvanic isolation is mandatory.

  3. Systems with extremely low quiescent current budgets (sub-µA sleep modes): The 48µA quiescent current is too high for ultra-low power applications where battery life depends on µA or nA standby currents. Use a low-IQ PFM buck or dedicated ultra-low-power current sense solution instead.


Application Notes


Gotchas

  1. [Offset drift under temperature extremes]: Engineers may assume the 3 µV input offset voltage is constant across temperature, but offset can vary significantly near the -40°C and 125°C limits. This causes apparent current measurement drift in cold or hot environments, leading to false alarms or missed faults.
    Fix: Characterize offset drift across temperature during validation and implement offset compensation or calibration in firmware.

  2. [Layout-induced input bias current increase]: Routing high-impedance nodes without guarding can cause leakage currents far exceeding the specified 500 pA input bias, distorting low-current measurements. This manifests as a static offset offset on the output that does not track input current.
    Fix: Use guard rings tied to low-impedance nodes around input traces and maintain clean PCB cleanliness to minimize leakage.

  3. [Startup under minimum supply voltage]: Applying supply below the 1.7 V minimum or slow ramp-up can cause the amplifier’s output to saturate or behave erratically during power-on, leading to incorrect initial current readings or latch-up conditions.
    Fix: Ensure supply voltage ramps above 1.7 V before enabling sensing circuitry, and verify with scope that output settles correctly on startup.

  4. [Output instability from high ESR capacitors]: Using output filtering capacitors with high Equivalent Series Resistance (ESR) can introduce phase shifts and oscillations due to the low gain-bandwidth product and slew rate, causing noisy or oscillatory output signals.
    Fix: Choose low-ESR ceramic capacitors for output filtering and validate stability with transient response tests.